Glen Hewitt - (co-investigator): has twelve years experience serving as a Scientific and Technical Advisor for Human Factors in Federal Aviation Administration Research and Acquisitions.  Previously, he conducted human factors support for system operational test and evaluation as a Senior Principal Scientist with the Atlantic Research Corporation.  Prior to that, he served with the Department of Defense where he conducted manpower and force planning, modeling, and analyses; and was instrumental in the development and implementation of Manpower and Personnel Integration (MANPRINT) and Human System Integration (HSI) programs.  In 1987, he fulfilled a Fellowship Program in Human Factors and Operations Research with the RAND Corporation.  He holds a BS in Engineering from the United States Military Academy and an MS in Systems Management and Safety from the University of Southern California.

Steve Murrill- (co-investigator): received a B.S. in electrical engineering from the University of Maryland, College Park in 1985. From 1985 to 1996, he worked with a team conducting research in the area of radiation effects on tactical and strategic electronics/systems at the U.S. Army Harry Diamond Laboratories/Army Research Laboratory. For the past 9 years he has been a member of the Army Research Laboratory's Electro-Optics and Photonics Division where he has worked on the advancement of passive, uncooled and cooled thermal imaging technology, active 3-D laser radar imaging technology, and super resolution image enhancement technology for undersampled thermal imaging systems.  In 2002, Mr. Murrill received a M.S. in Applied Biomedical Engineering from Johns Hopkins University in Baltimore, Maryland. Most recently, he was the POC and technical lead for the development of a computer-based, air-traffic-control-tower (ATCT) visibility analysis tool for the Federal Aviation Administration. Mr. Murrill has authored or co-authored over 20 published Army reports and over 10 published open-literature papers. He is a current member of IEEE and SPIE.